IotaMetrix Receives CIR Certification for Its Analytical Services

IotaMetrix's analytics services can now be integrated into its clients' CIRs.

Spun out of the XLIM laboratory (CNRS/University of Limoges) and based at the ESTER Technopole, IotaMetrix is developing a super-resolution confocal microscopy system designed for 3D metrology of surfaces and volumes. Its lateral resolution can be up to twice that of conventional confocal microscopy. At the same level of detail, it also allows for a less restrictive objective: no immersion is required, and it offers a longer working distance and a wider field of view.

Measurements are taken without contact or sample preparation. Laser-textured surfaces, ceramic parts, transparent components: each study begins with a feasibility analysis, coordinated with the customer using the customer’s own sample.

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