Webinar: "From Nanoscale Imaging to Engineering Decisions: Choosing the Right Metrology Method Under Tight Time Constraints" – March 25, 2026

Based in Limoges, the startup IotaMetrix develops non-destructive optical metrology systems for the quality control of materials and surfaces at the nanoscale.

It is hosting its first webinar on March 25, 2026, at 4:00 p.m. on the topic "From Nanoscale Imaging to Engineering Decisions: Choosing the Right Metrology Method Under Significant Time Constraints."

If you’ve ever wasted a week on SEM/AFM planning, sample preparation, and still couldn’t reach a conclusion, this webinar is for you. It compares SEM, AFM, confocal, and optical microscopy approaches using a simple decision-making framework: what works, what doesn’t, and common pitfalls.

This webinar is intended for engineers and researchers—whether working in an industrial setting or in a laboratory—who face challenges in characterizing surfaces and volumes, or who are seeking a second opinion on the most appropriate method for their specific needs.

Register by email: webinaire@iotametrix.fr‍