Webinar: "Why SEM Is No Longer Enough: The New Frontiers of 3D Roughness" – March 25, 2026

IotaMetrix develops non-destructive optical metrology systems for the quality control of materials and surfaces at the nanoscale.

She is hosting a webinar on March 25, 2026, at 4:00 p.m. to help you choose the right metrology method when time is of the essence.

This webinar will compare various metrology approaches for industry (SEM, AFM, confocal, and optical), their advantages and disadvantages, as well as how they complement one another, in order to address the challenges of characterizing objects for microelectronics and increasingly precise and complex structured materials.

Register by email: webinaire@iotametrix.fr‍